The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
May. 03, 2022
Dell Products L.p., Round Rock, TX (US);
Jianfei Yang, Chengdu, CN;
Ruiyang Zhang, Chengdu, CN;
Mingyi Luo, Chengdu, CN;
Weilan Pu, Chengdu, CN;
Lifeng Zheng, Chengdu, CN;
Xiaofeng Ge, Chengdu, CN;
Dell Products L.P., Round Rock, TX (US);
Abstract
An apparatus comprises a processing device configured to determine one or more testing goals for testing to be performed on one or more of a plurality of information technology assets of an information technology infrastructure and to select two or more of a plurality of testing plans based at least in part on scores assigned to respective ones of the plurality of testing plans, the assigned scores characterizing whether respective ones of the plurality of testing plans meet the determined one or more testing goals. The processing device is further configured to generate, utilizing one or more machine learning-based genetic algorithms that take as input the selected two or more testing plans, one or more additional testing plans, and to execute the one or more additional testing plans on the one or more of the plurality of information technology assets of the information technology infrastructure.