The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Jul. 31, 2025
Applicant:

Intuit Inc., Mountain View, CA (US);

Inventors:

Linoy Cohen, New York, NY (US);

Yakov Gazman, Hamadia, IL;

Tom Klein, Tel Aviv, IL;

Shon Mendelson, Tel Aviv, IL;

Assignee:

Intuit Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/09 (2023.01); G06F 18/22 (2023.01);
U.S. Cl.
CPC ...
G06N 3/09 (2023.01); G06F 18/22 (2023.01);
Abstract

Disclosed herein are system, method, apparatus, and computer-readable medium embodiments for a multi-tiered hierarchical language model judging system for efficient and accurate model evaluation. A system receives a first text string specifying a question from a first user interface and a second text string specifying an answer generated by a language model. The system receives, from a first model, a first token probability for the second set of one or more tokens and generates a first confidence score. Based on the first confidence score satisfying a threshold, the system outputs the second text string and the first confidence score to the user interface. If the first confidence score fails to satisfy the threshold, the system outputs the second text string and one of a second confidence score generated based on a second token probability from a second model or a third confidence score generated by a reasoning model.


Find Patent Forward Citations

Cohen, Linoy. (2026). Multi-tiered hierarchical language model judging system for efficient and accurate model evaluation (U.S. Patent No. 12645945). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12645945

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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