Techniques for measurement device calibration management using calibration offset generation machine learning models

Abstract

Various embodiments of the present invention utilize systems, methods, and computer program products that perform measurement device calibration management by utilizing calibration offset generation machine learning models that are generated using a model training routine that comprises, for each measurement environment feature value: (i) determining a plurality of inferred measurements by a measurement device in relation to a ground-truth measurement operation via performing the ground-truth measurement operation under simulated measurement conditions characterized at least in part by varying a measurement environment feature that is associated with the measurement environment feature value across a per-feature spectrum for the measurement environment feature; and (ii) generating the calibration offset generation machine learning model based at least in part on comparing the plurality of inferred measurements and a ground-truth measurement output for the ground-truth measurement operation.