The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Mar. 30, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Weibing Zhang, Beijing, CN;

Victor Lei Gao, Beijing, CN;

Hao Fang, Beijing, CN;

Donglei Wang, Beijing, CN;

Zhe He, Beijing, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 21/56 (2013.01);
U.S. Cl.
CPC ...
G06F 21/564 (2013.01); G06F 21/554 (2013.01);
Abstract

Techniques for snapshot classification involve generating a plurality of snapshots of a storage system at multiple times; clustering the plurality of snapshots into a first group of snapshots and a second group of snapshots based on data features of the plurality of snapshots; and determining a clean snapshot among the plurality of snapshots based on a comparison between the generation time of the first group of snapshots and the generation time of the second group of snapshots. Accordingly, a clean snapshot and a damaged snapshot can be automatically and quickly distinguished, thereby improving the efficiency of finding a clean snapshot and helping a user recover data quickly.


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