The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Aug. 23, 2024
Honeywell International Inc., Charlotte, NC (US);
Nagaraj Mugaluru Srinivasaiah, Bangalore, IN;
Devesh Bhatt, Maple Grove, MN (US);
Shanmugavalli Kannaiyan, Bangalore, IN;
Jan Hvozdovic, Prague, CZ;
Honeywell International Inc., Charlotte, NC (US);
Abstract
Systems and methods for improved testing of system implementation are described herein. In one example, a method includes receiving a test case based on requirements for a system, wherein a first subset of all system inputs includes defined system inputs for the test case, wherein a second subset of all system inputs includes undefined system inputs for the test case. The method further includes generating extended test vectors from the test case by replacing the undefined system inputs for the test case with different values, wherein each respective extended test vector includes a different combination of values for the undefined system inputs from other extended test vectors. The method further includes executing the extended test vectors on a target platform for the system. The method further includes verifying whether outputs generated during execution of the extended test vectors match expected values for the defined system outputs for the test case.