The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Nov. 23, 2022
Applicant:

Luminar Technologies, Inc., Orlando, FL (US);

Inventors:

Stephen L. Mielke, Oviedo, FL (US);

Julio Cesar Castaneda, Winter Park, FL (US);

Aseem D. Patil, Orlando, FL (US);

Christopher Gary Sentelle, Orlando, FL (US);

Assignee:

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/497 (2006.01); G01S 7/481 (2006.01); G01S 17/42 (2006.01); G01S 17/89 (2020.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 7/4817 (2013.01); G01S 7/4972 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01); G01S 17/931 (2020.01);
Abstract

A system comprises a light source, a scanner, a reference reflectivity material, a detector, and a processor. The light source is configured to emit light, and the scanner is configured to scan the emitted light across at least a portion of a reachable region including a field of regard through a window. The reference reflectivity material is included internally within a housing of the system and located in the reachable region but outside the field of regard. The detector is configured to detect at least a portion of the emitted light scattered by the reference reflectivity material. The processor is configured to analyze detected information from the detector to determine an electrical property of the emitted light.


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