The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Sep. 03, 2021
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 5/00 (2006.01); G01S 5/02 (2010.01); G01S 5/04 (2006.01); G01S 5/08 (2006.01);
U.S. Cl.
CPC ...
G01S 5/0036 (2013.01); G01S 5/021 (2013.01); G01S 5/04 (2013.01); G01S 5/0009 (2013.01); G01S 5/08 (2013.01);
Abstract
Techniques for enabling a cross-link interference (CLI) based uplink (UL) angle-of-arrival (AoA) estimations are disclosed. A victim user equipment (UE) may be configured with CLI resources to measure CLIs from one or more aggressor UEs. The victim UE may take the CLI opportunities also to estimate the AoAs of the UL signals from the aggressor UEs. In this way, UE's location estimation may be enhanced.
Ren, Yuwei. (2026). Angle calibration for cross-link interference angle-of-arrival estimation (U.S. Patent No. 12644949). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12644949
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile