The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Mar. 19, 2024
Applicant:

B2 Electronics Gmbh, Klaus, AT;

Inventors:

Stefan Baldauf, Zwischenwasser, AT;

Christian Mathies, Bartholomaeberg, AT;

Joseph Kruijen, Buch, AT;

Assignee:

b2 electronics GMbH, Klaus, AT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/14 (2006.01); G01R 31/12 (2020.01);
U.S. Cl.
CPC ...
G01R 31/14 (2013.01); G01R 31/1272 (2013.01);
Abstract

A testing device for testing a high or medium-voltage cable comprises a circuit arrangement with a test voltage generator, which comprises a low voltage-side earthing input and a high voltage-side output and is designed to provide a variable test voltage, a test specimen connection for connecting the high voltage-side output to a conductor of the cable, a protective earth connector for connecting to protective earth, a connecting conductor which electrically connects the low-voltage-side earth input to the protective earth connector, so that the connecting conductor represents a current collection point through which a measuring current flows during the test, and a high-frequency signal pick-up at the current collection point, at which a high-frequency pre-location signal is generated based on the measuring current. The testing device comprises evaluation electronics connected to the high-frequency signal pick-up for recording the high-frequency pre-location signal and is designed for defect distance evaluation.


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