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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12644913 B1

PDFFull Text
Date of Patent:
Jun. 02, 2026

Filed:

Dec. 05, 2022

Electromagnetic wave detector and electromagnetic wave detector array

Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Shimpei Ogawa, Tokyo, JP;

Masaaki Shimatani, Tokyo, JP;

Shoichiro Fukushima, Tokyo, JP;

Assignee:

MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;

Attorney:

XSENSUS LLP

Primary Examiner:

Eman A Alkafawi

Assistant Examiner:

Courtney G Mcdonnough

Int. Cl.
CPC ...
G01R 29/08 (2006.01); H10N 15/10 (2023.01);
U.S. Cl.
CPC ...
G01R 29/0878 (2013.01); H10N 15/15 (2023.02);
Abstract

An electromagnetic wave detector includes: a two-dimensional material layer including a first region and a second region disposed side by side in a first direction; a first electrode portion and a second electrode portion spaced from each other in the first direction and electrically connected to each other via the first region and the second region of the two-dimensional material layer; a first ferroelectric layer having a portion overlapping with the first region of the two-dimensional material layer in a plan view; and a second ferroelectric layer having a portion overlapping with the second region of the two-dimensional material layer in the plan view. The first ferroelectric layer and the second ferroelectric layer are provided such that, when irradiated with an electromagnetic wave, a voltage change that occurs in the first region is different from a voltage change that occurs in the second region.

Find Patent Forward Citations

Ogawa, Shimpei. (2026). Electromagnetic wave detector and electromagnetic wave detector array (U.S. Patent No. 12644913). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12644913

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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