The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Oct. 10, 2023
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Wataru Kohno, Tokyo, JP;

Sakiko Mishima, Tokyo, JP;

Tomoyuki Hino, Tokyo, JP;

Takashi Matsushita, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 5/00 (2006.01);
U.S. Cl.
CPC ...
G01P 5/00 (2013.01);
Abstract

An evaluation apparatus according to the present disclosure includes at least one memory storing a set of instructions, and at least one processor configured to execute the set of instructions and thereby to acquire, from a sensor, time-space data on vibrations that have occurred in an overhead optical fiber strung between poles, and evaluate, for each of predetermined analysis sections, a wind velocity and a propagation speed of wind in the analysis section based on the time-space data, and evaluate a wind direction in the analysis section based on the evaluated wind velocity and the propagation speed of the wind.


Find Patent Forward Citations

Kohno, Wataru. (2026). Evaluation apparatus, evaluation method, and non-transitory computer readable medium (U.S. Patent No. 12644903). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12644903

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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