The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Feb. 28, 2024
Samsung Sdi Co., Ltd., Yongin-si, KR;
Unist (Ulsan National Institute of Science and Technology), Ulsan, KR;
Seong Ho Woo, Yongin-si, KR;
Dae Sik Kim, Yongin-si, KR;
Sung Kook Lee, Yongin-si, KR;
Ji Young Kim, Yongin-si, KR;
Bo Ram Lee, Yongin-si, KR;
Hyun-Wook Lee, Ulsan, KR;
Changhyun Park, Ulsan, KR;
Ukhyun Jung, Ulsan, KR;
SAMSUNG SDI CO., LTD., Yongin-si, KR;
UNIST (Ulsan National Institute of Science and Technology), Ulsan, KR;
Abstract
A deformation analysis device for a secondary battery and a non-destructive analysis method by which electrode deformation of a secondary battery may be diagnosed using a computed tomography (CT) image, the method including the steps of obtaining an image by performing computed tomography (CT) on the secondary battery, generating an intensity graph using brightness differences from the image, measuring a core peak FWHM (full width at half maximum) or a core diameter change value from the intensity graph, and determining that the electrode assembly is deformed if the measured core peak FWHM is greater than a peak reference value or the core diameter change value is greater than a diameter reference value.
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