The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Jan. 12, 2021
University of Science and Technology of China, Hefei, CN;
University Of Science And Technology Of China, Hefei, CN;
Abstract
A transient absorption spectrometer using excitation by a pulse current, including: a central control unit; a pulse generator configured to generate a current pulse signal under an action of a first trigger signal sent by the central control unit, where the current pulse signal is applied to a sample to be tested such that the sample is in a non-luminous excited state for single-carrier injection or a luminous excited state for luminescence in which an electroluminescent signal is generated; a laser configured to emit a pulsed optical signal under an action of a second trigger signal sent by the central control unit; a beam splitter disposed in a light-exiting direction of the laser, and configured to split the pulsed optical signal into a detection optical signal and a reference optical signal, where the detection optical signal irradiates the sample to be tested to generate a detected optical signal; a data acquisition unit configured to acquire, under an action of a third trigger signal and a fourth trigger signal sent by the central control unit, the electroluminescent signal, the detected optical signal and the reference optical signal, and perform a processing to obtain electrical signal data indicating, at a single time instant, absorption intensities of the sample for optical signals of different wavelengths; and a data processing and imaging unit configured to process the electrical signal data to obtain a transient absorption signal of the sample to be tested and perform imaging.