The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Mar. 06, 2023
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventor:
Falk Schlaudraff, Wetzlar, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); G01N 1/30 (2006.01); G01N 1/31 (2006.01); G01N 33/483 (2006.01);
U.S. Cl.
CPC ...
G01N 1/30 (2013.01); G01N 1/312 (2013.01); G01N 33/4833 (2013.01); G01N 2001/305 (2013.01); G01N 2001/317 (2013.01);
Abstract
A method includes applying a liquid cover to a microscopic sample to obtain a processed microscopic sample, generating at least one marker for a part of the processed microscopic sample using an imaging system, removing at least a part of the liquid cover from the processed microscopic sample to obtain an uncovered microscopic sample, and extracting a part of the uncovered microscopic sample, based on the at least one marker, to obtain an extracted part.