The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Dec. 22, 2025
Applicant:

Fanshengda Industrial Development (Shenzhen) Co., Ltd., Shenzhen, CN;

Inventor:

Jianli Deng, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 1/024 (2021.01); G01K 1/08 (2021.01);
U.S. Cl.
CPC ...
G01K 1/024 (2013.01); G01K 1/08 (2013.01);
Abstract

The present disclosure provides a temperature measurement device, comprising: a metal housing, the metal housing comprising a first metal portion and a second metal portion, the second metal portion having a tip for inserting into food; an intermediate electrical isolation portion for connecting the first metal portion and the second metal portion, the intermediate electrical isolation portion configured to electrically isolate the first metal portion and the second metal portion when they are connected to the intermediate electrical isolation portion; a circuit board unit at least located within the second metal portion, the circuit board unit being connected to an antenna unit; wherein the first metal portion and the second metal portion respectively serve as electrodes of the temperature measurement device, and the first metal portion serves as part of the antenna unit of the temperature measurement device.


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Deng, Jianli. (2026). Temperature measurement device (U.S. Patent No. 12644775). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12644775

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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