The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Jun. 25, 2024
Applicant:

Htc Corporation, Taoyuan City, TW;

Inventors:

Bo-Wen Xiao, Taoyuan City, TW;

Yen-Fang Cheng, Taoyuan City, TW;

Assignee:

HTC Corporation, Taoyuan City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/18 (2006.01); G01J 3/02 (2006.01); G01J 3/06 (2006.01);
U.S. Cl.
CPC ...
G01J 3/18 (2013.01); G01J 3/0208 (2013.01); G01J 3/0237 (2013.01); G01J 3/0275 (2013.01); G01J 3/06 (2013.01); G01J 2003/1861 (2013.01);
Abstract

A spectrum measurement device includes a scanning light receiver, an optical component, and a processor. The scanning light receiver, on a plane, receives a plurality of light beams of a display image sequentially according to a scanning operation to generate a plurality of input light beams sequentially. The optical component receives the input light beams sequentially and generates a plurality of pieces of processed information. The processor obtains luminance and chromaticity information of the display image according to the processed information.


Find Patent Forward Citations

Xiao, Bo-Wen. (2026). Spectrum measurement device (U.S. Patent No. 12644767). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12644767

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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