The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Sep. 10, 2023
Schott Ag, Mainz, DE;
Ulrich Peuchert, Bodenheim, DE;
Christoph Hindriksen, Hildesheim, DE;
Alexander Glacki, Hannover, DE;
Thomas Wiegel, Alfeld, DE;
Andreas Langsdorf, Ingelheim am Rhein, DE;
Frank Büllesfeld, Kriftel, DE;
Matthias Jotz, Mainz am Rhein, DE;
Mohd Sairul Nizam Omar, Sungai Petani, MY;
Jonathan Leon Ruckes, Mainz, DE;
SCHOTT AG, Mainz, DE;
Abstract
A glass article is provided that has two plane-parallel main sides, a thickness between the two plane-parallel main sides of less than 3.0 mm, an average near-surface level of damage (ONSL) on each of the two plane-parallel main sides, and an average location-thickness variation (ODS) normalized with respect to the thickness on the specified measuring area. The average near-surface level of damage is less than 2000 damages with an extension of less than 1.0 μm. The specified measuring area is 2×2 mm. The average location-thickness variation (ODS) normalized is less than 10 nm per μm thickness of the glass article. The average location-thickness variation (ODS) is a difference between a highest thickness and a lowest thickness within the specified measuring area.