The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Oct. 25, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Hirokazu Sekino, Chino, JP;

Shoichi Takasuna, Shiojiri, JP;

Yasunori Onishi, Shiojiri, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B05B 1/02 (2006.01); B05B 1/08 (2006.01);
U.S. Cl.
CPC ...
B05B 1/08 (2013.01); B05B 1/02 (2013.01);
Abstract

A method of determining an aperture area of a nozzle hole in a droplet jet device including a flow channel through which a liquid flows and the nozzle hole configured to spray the liquid, the method including determining the aperture area [m] of the nozzle hole so that a jet flow of the liquid sprayed from the nozzle hole is fragmented into droplets, the liquid having a value of ρ/σ determined from a density [kg/m] of the liquid and a surface tension [N/m] of the liquid in a range no lower than 300 and no higher than 900, and a kinematic viscosity coefficient [m/s] of the liquid in a range no lower than 1.0E-6 and no higher than 2.0E-5.


Find Patent Forward Citations

Sekino, Hirokazu. (2026). Method of determining aperture area and droplet jet device (U.S. Patent No. 12643113). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12643113

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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