The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Jun. 25, 2024
Applicants:

Randall Arthur, Campbell, CA (US);

Anthony E. Dimalanta, San Jose, CA (US);

Nguyen Phuoc Luu, Los Gatos, CA (US);

Paul R. Overmyer, Sunnyvale, CA (US);

Chinlee Wang, Saratoga, CA (US);

Inventors:

Randall Arthur, Campbell, CA (US);

Anthony E. Dimalanta, San Jose, CA (US);

Nguyen Phuoc Luu, Los Gatos, CA (US);

Paul R. Overmyer, Sunnyvale, CA (US);

Chinlee Wang, Saratoga, CA (US);

Assignee:

X-Scan Imaging Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/58 (2024.01); G01N 23/04 (2018.01); G01T 1/20 (2006.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
A61B 6/586 (2013.01); G01N 23/04 (2013.01); G01T 1/20 (2013.01); G01T 1/244 (2013.01);
Abstract

A high-energy x-ray camera with radiation-hardened fiber optic faceplate to protect its sensor chip from radiation damage, a field-replaceable scintillator which degrades under radiation. A signal and SNR monitoring system and method to optimize the scintillator replacement schedule.


Find Patent Forward Citations

Arthur, Randall. (2026). Non-destructive x-ray imaging detector utilizing artificial intelligence to optimize system efficiency (U.S. Patent No. 12642500). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12642500

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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