The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Jul. 13, 2023
Eosdx Inc., Mountain View, CA (US);
Alexander P. Lazarev, Lake Forest, CA (US);
Pavel Lazarev, Box Elder, SD (US);
EosDx Inc., Menlo Park, CA (US);
Abstract
In some embodiments an X-ray system comprises a work-station and a mammography apparatus. The mammography apparatus can comprise: a breast positioning area; a diffraction enhanced X-ray imaging apparatus; and a diffractometer for analyzing structure of tissue within a breast. The diffraction enhanced X-ray imaging apparatus and the diffractometer can be configured to move in order to interchangeably align with the breast positioning area. The work-station can be configured to control, and to process data received from, the mammography apparatus. In some embodiments, a method of controlling an X-ray system comprises: performing a diffraction enhanced X-ray imaging measurement of the breast tissue; processing the diffraction enhanced X-ray imaging measurement results using the work-station to determine coordinates of potential cancer sites; performing measurements at the coordinates of the potential cancer sites using the diffractometer; and processing the diffractometer measurement results to perform diagnostics.