The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Nov. 02, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yoshinori Hirano, Chiba, JP;

Ryuta Ueda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2024.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/5235 (2013.01); G06T 5/50 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30096 (2013.01);
Abstract

An X-ray computed tomography (CT) apparatus includes an X-ray tube configured to radiate X-rays; a detector configured to detect X-rays radiated by the X-ray tube and passed through a subject; a reconstruction processing unit configured to reconstruct imaging data output by the detector and generate CT image data and material decomposition image data; a first inference unit configured to perform inference on the material decomposition image data; a second inference unit configured to perform inference on the CT image data; a third inference unit configured to perform inference on composite image data; a selection unit configured to, in a case where an inference result of the first inference unit is different from an inference result of the second inference unit, select an inference result of the third inference unit; and a display control unit configured to cause the selected inference result to be displayed.


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