The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Mar. 30, 2023
Fujifilm Corporation, Tokyo, JP;
Yuta Kawamoto, Kanagawa, JP;
Hisashi Endo, Kanagawa, JP;
Tomonori Yokota, Kanagawa, JP;
Takashi Osanai, Kanagawa, JP;
Satoshi Ozawa, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An endoscope system includes an endoscope and a processor device. The processor device functions as an abnormality detection unit, an abnormality information generation unit, and an abnormality information management unit. The abnormality detection unit detects an abnormality of the endoscope by using information detected by an image sensor of the endoscope. The abnormality information generation unit generates abnormality information including sensor information detected by the image sensor at a time of abnormality detection and in a predetermined period before and after the abnormality detection and operating information of the endoscope. The abnormality information management unit stores the abnormality information in a memory.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile