The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Mar. 25, 2021
Applicant:

Sharp Display Technology Corporation, Kameyama City, JP;

Inventors:

Takao Saitoh, Kameyama City, JP;

Yohsuke Kanzaki, Kameyama City, JP;

Masaki Yamanaka, Kameyama City, JP;

Masahiko Miwa, Kameyama City, JP;

Yi Sun, Kameyama City, JP;

Masaki Fujiwara, Kameyama City, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10K 59/131 (2023.01); H10K 59/12 (2023.01); H10K 71/40 (2023.01); H10K 71/70 (2023.01);
U.S. Cl.
CPC ...
H10K 59/1315 (2023.02); H10K 59/1201 (2023.02); H10K 71/40 (2023.02); H10K 71/70 (2023.02);
Abstract

A second test portion includes a second test first terminal, a second test second terminal, a second test third terminal, and a second test fourth terminal electrically connected to a second test semiconductor layer via respective contact holes formed in a layered film of a gate insulating film and an interlayer insulating film, and the layered film of the gate insulating film and the interlayer insulating film in the second test portion is provided with an opening open upward between at least one of the second test first terminal, the second test second terminal, the second test third terminal, and the second test fourth terminal.


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