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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12641954 B1

PDFFull Text
Date of Patent:
May. 26, 2026

Filed:

Sep. 20, 2023

Measuring method and measuring device

Applicant:

Magnolia White Corporation, Tokyo, JP;

Inventor:

Satoru Tomita, Tokyo, JP;

Assignee:

MAGNOLIA WHITE CORPORATION, Tokyo, JP;

Attorney:

XSENSUS LLP

Primary Examiner:

Bitew A Dinke

Int. Cl.
CPC ...
H10K 59/12 (2023.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01); H10K 59/121 (2023.01); H10K 77/10 (2023.01); H10K 102/00 (2023.01);
U.S. Cl.
CPC ...
H10K 59/1201 (2023.02); G02B 21/26 (2013.01); G02B 21/361 (2013.01); G02B 21/365 (2013.01); H10K 59/121 (2023.02); H10K 77/10 (2023.02); H10K 2102/302 (2023.02);
Abstract

According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a first surface side of a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image including the partition observed from a second surface side opposed to the first surface of the base by an optical microscope, analyzing the acquired first image, and measuring an amount of protrusion by which an end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.

Find Patent Forward Citations

Tomita, Satoru. (2026). Measuring method and measuring device (U.S. Patent No. 12641954). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12641954

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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