The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Oct. 26, 2023
Applicant:

Coretronic Corporation, Hsin-Chu, TW;

Inventors:

Chien-Chun Peng, Hsin-Chu, TW;

Chia-Yen Ou, Hsin-Chu, TW;

Kang-Shun Hsu, Hsin-Chu, TW;

Hsun-Cheng Tu, Hsin-Chu, TW;

Assignee:

Coretronic Corporation, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3105 (2013.01); H04N 9/3147 (2013.01); H04N 9/3182 (2013.01); H04N 9/3194 (2013.01);
Abstract

A method for adjusting a projection parameter and a projection system are disclosed. In the projection system, a processor is configured to drive multiple projectors to project multiple projection images respectively and obtain a full projection range through calculation, select a target area from at least one overlapping area included in the full projection range and obtain a target projection parameter value of the target area, obtain multiple intersection points of the overlapping area on a boundary of the full projection range, define connecting lines between a center point of the target area and the intersection points as dividing lines to divide the full projection range into multiple sub-areas, respectively adjust a projection parameter value of each of the sub-areas according to the target projection parameter value of the target area, and perform projection through the corresponding projector based on the adjusted projection parameter value of each of the sub-areas.


Find Patent Forward Citations

Peng, Chien-Chun. (2026). Method for adjusting projection parameter and projection system (U.S. Patent No. 12641203). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12641203

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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