The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Apr. 18, 2024
Applicant:

Qomplx Llc, Reston, VA (US);

Inventors:

Jason Crabtree, Vienna, VA (US);

Richard Kelley, Woodbridge, VA (US);

Assignee:

QOMPLX LLC, Reston, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); G06F 16/215 (2019.01); G06F 16/2458 (2019.01); G06F 16/951 (2019.01); G06F 21/62 (2013.01); H04L 67/1097 (2022.01);
U.S. Cl.
CPC ...
H04L 63/20 (2013.01); G06F 16/215 (2019.01); G06F 16/2477 (2019.01); G06F 16/951 (2019.01); G06F 21/6218 (2013.01); H04L 63/1425 (2013.01); H04L 63/1433 (2013.01); H04L 63/1441 (2013.01); H04L 67/1097 (2013.01);
Abstract

Detection and mitigation of data source compromises in an adversarial information environment, featuring the ability to scan for, ingest and process, and then use relational, wide column, and graph stores for capturing entity data, their relationships, and actions associated with them. Metadata is gathered and linked to the ingested data, which provides a broader contextual view of the environment leading up to and during an event of interest. Data quality analysis is conducted as data is ingested in order to identify if a data source may be compromised. The results are used to manage the reputation of the contributing data sources.


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