The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Nov. 28, 2023
Applicant:

Idexx Laboratories, Inc., Westbrook, ME (US);

Inventor:

Jeremy Hammond, Standish, ME (US);

Assignee:

IDEXX LABORATORIES, INC., Westbrook, ME (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G16H 40/60 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G16H 40/60 (2018.01); G16H 50/20 (2018.01);
Abstract

The present disclosure pertains to methods and systems that calibrate a diagnostic analyzer by first determining whether first diagnostic results exceed a predetermined threshold from a first diagnostic target and adjusting one or more laser settings for the diagnostic analyzer in response. New patient samples are interrogated by the diagnostic analyzer, using the adjusted laser parameters, to determine weighted averaged diagnostic results. In a case where the weighted averaged diagnostic results fall outside of the permissible range, multiplying factors for calibration factors that permit the weighted averaged diagnostic results to fall within the permissible range are determined, and the diagnostic analyzer is calibrated by adjusting the calibration factors corresponding to the parameters of the diagnostic analyzer based at least in part on the multiplying factors.


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