The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Nov. 14, 2023
Applicant:

Mercedes-benz Group Ag, Stuttgart, DE;

Inventors:

Thomas Monninger, Menlo Park, CA (US);

Aaron Brown, Santa Clara, CA (US);

Assignee:

Mercedes-Benz Group AG, Stuttgart, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G07C 5/08 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G07C 5/0816 (2013.01); G06F 11/0739 (2013.01); G06F 11/079 (2013.01); G06F 11/0793 (2013.01);
Abstract

A method for error event analysis performed by an electronic device includes: in response to an error event of an autonomous driving system, feeding a sequence of signal states, collected from the autonomous driving system into a prediction model, where the prediction model is trained based on signal states collected from a plurality of autonomous driving systems for predicting, based on a first signal state, a second signal state, the first signal state representing signals collected at a first time, and the second signal state representing signals collected at a second time succeeding the first time; converting the error event into an event signal state having signal values at an event time; comparing the second signal state with the event signal state; and in response to the second signal state matching the event signal state, tracing the error event back to the first signal state as a root cause.


Find Patent Forward Citations

Monninger, Thomas. (2026). Method, electronic device, and autonomous driving system for error event analysis (U.S. Patent No. 12639994). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12639994

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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