The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Aug. 29, 2023
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Digital Solutions Corporation, Kawasaki-shi, JP;
Tomoya Tsuruyama, Kawasaki Kanagawa, JP;
Hidetaka Ohira, Tokyo, JP;
KABUSHIKI KAISHA TOSHIBA, Kawasaki, JP;
TOSHIBA DIGITAL SOLUTIONS CORPORATION, Kawasaki, JP;
Abstract
A robustness measurement device of an embodiment includes an acquirer, a noise adder, an inference result group generator, and a robustness measurer. The acquirer acquires an input image. The noise adder adds noise to the input image to generate at least one noise-added image by adding noise to the input image. The inference result group generator generates an inference result group by grouping mutually associated inference results among inference results for at least one of the input image or the noise-added image. The robustness measurer measures robustness of a test target model on the basis of the inference result group.