The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
May. 20, 2021
Nec Corporation, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A measurement condition optimization system according to an aspect of the present disclosure includes: a three-dimensional data input unit that inputs three-dimensional data of a measurement target installation in a predetermined facility measured using a measurement device; an overlapping portion determination unit that performs alignment processing on each piece of the input three-dimensional data, and determines an overlapping portion included in the three-dimensional data after the alignment processing; a measurement policy acquisition unit that acquires a measurement policy at the time of acquiring the three-dimensional data of the measurement target installation in the facility using the measurement device; and a measurement condition adjustment unit that adjusts a measurement condition to satisfy the measurement policy acquired by the measurement policy acquisition unit and make the overlapping portion included in the three-dimensional data determined by the overlapping portion determination unit within a predetermined range.