The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Jul. 20, 2023
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Debapriya Maji, Asansol, IN;

Soyeb Nagori, San Diego, CA (US);

Deepak Poddar, Bangalore, IN;

Manu Mathew, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06N 3/045 (2023.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G06T 7/75 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Disclosed herein are systems and methods that provide an end-to-end approach for performing multi-dimensional object pose estimation in the context of machine learning models. In an implementation, processing circuitry of a suitable computer inputs image data to a machine learning model that predicts a parameterized rotation vector and a parameterized translation vector for an object in the image. Next, the processing circuitry converts the parameterized rotation vector and the parameterized translation vector into a non-parameterized rotation vector and a non-parameterized translation vector respectively. Finally, the processing circuitry updates the image data based on the non-parameterized rotation vector and the non-parameterized translation vector.


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