The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Aug. 15, 2023
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Hiroo Ikeda, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 7/70 (2017.01); G06T 2207/10016 (2013.01);
Abstract

To detect a stagnant object by an image analysis at high accuracy, the present invention provides an image processing apparatusincluding: an acquisition unitthat acquires partial region information for each frame image, the partial region information indicating a situation of a target object in each of a plurality of partial regions within one image for each frame image; and an extraction unitthat extracts the partial region from a plurality of the partial regions, based on the partial region information for the each frame image, the partial region to be extracted satisfying at least one of a condition that presence of a plurality of the target objects continues at a predetermined level or higher and a condition that uniformity of a state of an aggregation constituted by a plurality of the target objects being present continues at a predetermined level or higher.


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