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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12639816 B1

PDFFull Text
Date of Patent:
May. 26, 2026

Filed:

Feb. 25, 2022

Semi-supervised fundus image quality assessment method using ir tracking

Applicants:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Homayoun Bagherinia, Dublin, CA (US);

Aditya Nair, Dublin, CA (US);

Niranchana Manivannan, Dublin, CA (US);

Mary Durbin, San Francisco, CA (US);

Lars Omlor, Dublin, CA (US);

Gary Lee, Dublin, CA (US);

Assignees:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Carl Zeiss Meditec AG, Jena, DE;

Attorney:

SNELL & WILMER L.L.P

Primary Examiner:

Trang U Tran

Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/246 (2017.01); G06V 10/74 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01); G06V 10/94 (2022.01); G06V 20/50 (2022.01); G06V 40/18 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G06T 7/248 (2017.01); G06V 10/761 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01); G06V 10/95 (2022.01); G06V 20/50 (2022.01); G06V 40/197 (2022.01); G06T 2207/10016 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30041 (2013.01);
Abstract

System/Method/Device for labelling images in an automated manner to satisfy a performance of a different algorithm and then applying active learning to learn a deep learning model which would enable 'real-time' operation of quality assessment and with high accuracy.

Find Patent Forward Citations

Bagherinia, Homayoun. (2026). Semi-supervised fundus image quality assessment method using ir tracking (U.S. Patent No. 12639816). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12639816

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