The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Feb. 06, 2024
Applicant:
Sap SE, Walldorf, DE;
Inventors:
Yinan He, Singapore, SG;
Xinyan Chen, Singapore, SG;
Rajesh Vellore Arumugam, Singapore, SG;
Anantharaman Ravi, Singapore, SG;
Assignee:
SAP SE, Walldorf, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 2207/20081 (2013.01); G06T 2210/12 (2013.01);
Abstract
Methods, systems, and computer-readable storage media for a defect detection system that generates synthetic defect data that is representative of real-world defects in products. The synthetic defect data is included in training data for training a defect detection model. The defect detection model is deployed to a production environment to detect defects in products.