The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Sep. 21, 2022
Boe Technology Group Co., Ltd., Beijing, CN;
Qing Zhang, Beijing, CN;
Quanguo Zhou, Beijing, CN;
Jiuyang Cheng, Beijing, CN;
Lijia Zhou, Beijing, CN;
Zhidong Wang, Beijing, CN;
Hao Tang, Beijing, CN;
Meng Guo, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
Provided is a method of training an image recognition model, the model is configured to detect a defect region in an image of a display substrate, the display substrate includes a display area and a connection area, and the method includes: acquiring a first training sample including images of n display substrates; dividing each of the images of n display substrates into a first sub image and a second sub image, the first sub image is an image of a display area, and the second sub image is an image of a connection area; inputting the first training sample into the image recognition model, the first training sample includes the first sub image and the second sub image; and adjusting at least one feature parameter of the image recognition model to reduce a difference between an output value of the model and a training value of the first training sample.