The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Jan. 26, 2023
Applicant:

The Board of Trustees of the University of Illinois, Urbana, IL (US);

Inventors:

Kayvan Forouhesh-Tehrani, Urbana, IL (US);

Stephen A. Boppart, Champaign, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/4053 (2024.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4053 (2013.01); G06T 5/50 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20212 (2013.01);
Abstract

Super-resolution label-free microscopy is provided using multiplexed, temporally modulated acquisition patterns of emission point spread functions ('PSFs'). Supercontinuum ultrafast pulses can be used to enhance nonlinear processes, such as autofluorescence and harmonic generation, in order to provide super-resolution imaging of nonlinear label-free signals. Images can be reconstructed using various reconstruction techniques, including pixel reassignment, wavelet reconstruction, and deep learning model-based reconstructions.


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