The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Jan. 18, 2024
Target Brands, Inc., Minneapolis, MN (US);
Travis James Noll, St. Paul, MN (US);
Venkata Rao Putrevu, Maple Grove, MN (US);
Grady Michael Johnson, Eden Prairie, MN (US);
Katherine Ann Sorensen, Elk River, MN (US);
Venkata Naga Anitha Ganta, Plymouth, MN (US);
Alexander Jacques Bates, St. Paul, MN (US);
Kristen Sullivan, Zimmerman, MN (US);
Rachel Lin Alderman, Hanover, MN (US);
Target Brands, Inc., Minneapolis, MN (US);
Abstract
The disclosed system provides real-time detection and remediation of metric anomalies in a replenishment network. A computer system can receive, from data sources, event data, retrieve historic metric data associated with a metric of a retail environment, aggregate the event data and historic metric data into aggregated data for the metric, store the aggregated data in a cache data store, determine, based on applying a statistical algorithms model to the cached aggregated data, (i) a predicted metric value and (ii) upper and lower tolerance bounds for the metric, iteratively receive the event data, aggregate the data, and determine (i) and (ii) until (a) determining a condition is triggered to evaluate the metric or (b) expiration of a time period to which the predicted value and the upper and lower tolerances apply, and return, based on determining the condition is triggered to evaluate the metric, information about metric anomalies.