The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Jul. 10, 2023
Applicant:

Nec Corporation of America, Herzlia, IL;

Inventors:

Yaacov Hoch, Ramat-Gan, IL;

Maya Cohen Maimon, Holon, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

There is provided a computer implemented method of detecting data drift for changing a machine learning (ML) model, comprising: monitoring a target input dataset for being fed into the ML model, extracting a plurality of target candidate features from the target input dataset, applying a feature selection process for selecting a target subset of the plurality of target candidate features, accessing a historical input dataset previously determined as being suitable for being fed into the ML model, extracting a plurality of historical candidate features from the historical input dataset, applying the feature selection process for selecting a historical subset of the plurality of historical candidate features, computing a comparison between the target subset and the historical subset, and in response to the comparison meeting a requirement indicating a significant difference between the target subset and the historical subset, generating an indication for changing the ML model.


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