The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Nov. 13, 2024
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Young Goo Cho, Seoul, KR;

Jaehyok Chong, Seoul, KR;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/2458 (2019.01); G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2462 (2019.01); G06F 16/2453 (2019.01);
Abstract

A computer implemented method can receive a query for a database table. The query has a filter having a first predicate and a second predicate. The first predicate specifies a first condition evaluating values in a first column of the database table and the second predicate specifies a second condition evaluating values in a second column of the database table. The method can obtain a projection histogram including base statistics of the first column and projected statistics of the second column and determine an output size of the filter based on the projection histogram. The base statistics includes a plurality of intervals and respective counts of cells in the first column whose values are within corresponding intervals. The projected statistics includes a plurality of ranges corresponding to the plurality of intervals, respectively. Related systems and software for implementing the method are also disclosed.


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