The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Jun. 04, 2024
Applicant:

Mellanox Technologies, Ltd., Yokneam, IL;

Inventors:

Yacob Penso, Ashdod, IL;

Ran Sandhaus, Tel Aviv, IL;

Vladimir Shalikashvili, Petah-Tiqwa, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06F 16/901 (2019.01); G06F 16/906 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3466 (2013.01); G06F 11/3006 (2013.01); G06F 16/9024 (2019.01); G06F 16/906 (2019.01);
Abstract

Embodiments of the present disclosure are directed to sampling telemetric values of computing devices in an efficient manner. Generally speaking, embodiments described herein are directed to sampling counters and gauges of computing devices in a network, data center, etc. in a way that reduces redundant and non-informative signals, while being adaptive when sampling with high granularity desirable. According to one embodiment, counters can be correlated with each other, sharing residual information, and therefore, sampling only a subset of them, or a 'representative' can be sufficient in representing a current state. When there is a notable change in the representative, the telemetry sampling procedure can increase its granularity and sample not only the representative but also the underlying group of telemetric values.


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