The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Apr. 03, 2024
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Jan Hvozdovic, Prague, CZ;

Devesh Bhatt, Maple Grove, MN (US);

Edward Schlossmacher, Phoenix, AZ (US);

Nagaraj Mugaluru Srinivasaiah, Bangalore, IN;

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01);
Abstract

In one example, a method includes receiving one or more test scenarios based on requirements for a system under test having one or more inputs, wherein a value for at least one input of the one or more inputs is undefined for at least one test scenario of the one or more test scenarios. The method further includes determining system intermediate values and system output values that are unambiguously derivable from defined system inputs for the one or more test scenarios. The defined system inputs are defined in the one or more test scenarios and not assumed or default input values. The method further includes determining coverage of one or more functional characteristics of each function of the system under test executed based on the defined system inputs. The method further includes validating the determined system output values that are unambiguously derivable from the defined system inputs.


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