The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Mar. 20, 2024
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Seema Nagar, Bangalore, IN;

Ruchi Mahindru, Elmsford, NY (US);

Harshit Kumar, New Delhi, IN;

Mudit Verma, New Delhi, IN;

Tuan Minh Hoang Trong, Jackson Heights, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0709 (2013.01); G06F 11/3419 (2013.01); G06F 11/3447 (2013.01); G06F 11/3457 (2013.01);
Abstract

Systems, methods, and techniques that facilitate application fingerprint generation are provided. One or more embodiments described herein can comprise a computer-implemented method comprising determining, by a device operatively coupled to a processor, fault proneness of one or more microservices regarding one or more fault categories, generating, by the device, an ordered seed set of the one or more microservices based on the determined fault proneness, generating, by the device, an augmented ordered seed set of the one or more microservices based on topological relationships of the one or more microservices and based on the ordered seed set, and building, by the device, a set of one or more patterns of resource constraint faults and a set of one or more patterns of entity experience faults based on the augmented ordered seed set of the one or more microservices.


Find Patent Forward Citations

Loading…