The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Dec. 30, 2021
Applicant:

Inspur Suzhou Intelligent Technology Co., Ltd., Suzhou, CN;

Inventors:

Mingwei Wu, Suzhou, CN;

Hongrui Han, Suzhou, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 15/14 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 15/144 (2013.01);
Abstract

A measurement correction method and apparatus for a sensor, and a server power supply. The method is applied to a sensor comprising a shunt resistor and a differential amplifier, and comprises: performing compensation verification on the sensor in advance to obtain a compensation coefficient of the sensor (S); obtaining a voltage signal output by the sensor (S); and correcting the voltage signal according to an error value of the shunt resistor and the compensation coefficient to obtain a voltage correction signal for use in system optimization management (S).


Find Patent Forward Citations

Wu, Mingwei. (2026). Measurement correction method and apparatus for sensor, and server power supply (U.S. Patent No. 12638535). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12638535

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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