The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
May. 15, 2024
Siemens Healthineers Ag, Forchheim, DE;
Thorsten Feiweier, Poxdorf, DE;
Mario Zeller, Erlangen, DE;
Adam Kettinger, Erlangen, DE;
Michael Köhler, Nuremberg, DE;
Max Müller, Erlangen, DE;
Siemens Healthineers AG, Forchheim, DE;
Abstract
Techniques are described for complex preprocessing steps to ensure consistency of sorted sets of reference measurement data, which have conventionally been required when sorting reference measurement data sets for DPG algorithms captured using an EPI technique, to be omitted because items of reference measurement data captured via the described techniques are already consistent in themselves. Therefore, for each polarity of the read-out gradients, a set of fully sampled reference measurement data is available, which is already suitable for carrying out a dual-polarity (DP) algorithm without any further measures.