The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Mar. 08, 2024
Samsung Electronics Co., Ltd., Suwon-si, KR;
Woongki Min, Suwon-si, KR;
Hyeonji Han, Suwon-si, KR;
Myeongcheol Kim, Suwon-si, KR;
Hyoungjoong Kim, Suwon-si, KR;
Sangho Kim, Suwon-si, KR;
Younggyun Oh, Suwon-si, KR;
Soomin Lee, Suwon-si, KR;
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Abstract
An eye margin test method includes receiving an analog input signal, receiving an analog input signal, generating a recovery clock signal based on the digital input signal, delaying the recovery clock signal by adjusting a first delay control code, obtaining a first delay margin code based on the delayed recovery clock signal, delaying the digital input signal by adjusting a second delay control code, obtaining a second delay margin code based on the delayed digital input signal, and obtaining an eye margin code by adding the first delay margin code and the second delay margin code.