The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Nov. 23, 2022
Applicant:

Fulian Yuzhan Precision Technology Co., Ltd., Shenzhen, CN;

Inventors:

Chen-Ting Wu, New Taipei, TW;

Hong-Wei Zhang, Zhengzhou, CN;

Qing-Yu Wang, Shenzhen, CN;

Li Yan, Shenzhen, CN;

Deng-Kui Tian, Shenzhen, CN;

Cheng-Lun Lee, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
G01N 21/25 (2013.01);
Abstract

A data analysis method for optimization of aluminum anodizing and dyeing process acquires a plurality of sample data groups, each sample data groups comprising dyeing result data and parameter data of multiple processing parameters. Contribution value of each processing parameter data relative to the dyeing result data in each of the plurality of sample data groups is determined, and the contribution values are used to determine at least one essential processing parameter. The essential processing parameters are then adjusted according to a data analysis result for improving quality of products. A computing device and storage medium are also provided.


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