The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

May. 13, 2022
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Jan-Peter Antin, Västerås, SE;

Mats Åslund, Hallstahammar, SE;

Emma Thelin, Uppsala, SE;

Johnnie Blom, Västerås, SE;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/08 (2006.01); G01J 1/42 (2006.01); G01R 31/12 (2020.01); H02H 1/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/08 (2013.01); G01J 2001/083 (2013.01); G01J 1/42 (2013.01); G01J 2001/4238 (2013.01); G01R 31/1218 (2013.01); H02H 1/0023 (2013.01);
Abstract

A testing arrangement is provided for an arc detecting system that includes at least one optical detector at a piece of electric equipment, where the testing arrangement includes at least one light source and a testing unit, where the testing unit is configured to control the light source to emit a test light to the optical detector with steps of increasing luminance starting from a minimum test level and continuing towards a maximum test level, investigate if the optical detector detects the emitted test light and determine that the arc detecting system is operational if the optical detector is able to detect the test light at any of the used test levels.


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