The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Apr. 23, 2020
Hewlett-packard Development Company, L.p., Spring, TX (US);
Fausto D'apuzzo, Palo Alto, CA (US);
Viktor Shkolnikov, Palo Alto, CA (US);
Alexander Govyadinov, Corvallis, OR (US);
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Abstract
An example method for measuring deformability of a cell, consistent with the present disclosure, includes detecting a single cell of a biologic sample in a cell probing chamber of a microfluidic device. The method includes isolating the cell in the cell probing chamber of the microfluidic device by terminating the flow of the biologic sample through the microfluidic device. The method further includes causing deformation of the cell by introducing ultrasonic waves into the cell probing chamber, and measuring deformability of the cell responsive to the introduction of the ultrasonic waves.