The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Jun. 02, 2023
Applicant:

Terumo Kabushiki Kaisha, Tokyo, JP;

Inventor:

Masatsugu Igarashi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/26 (2006.01); C12M 1/12 (2006.01); G01N 1/20 (2006.01); G01N 1/14 (2006.01);
U.S. Cl.
CPC ...
C12M 33/04 (2013.01); C12M 33/12 (2013.01); C12M 37/00 (2013.01); G01N 1/2035 (2013.01); G01N 2001/1445 (2013.01); G01N 2001/205 (2013.01);
Abstract

A sampling system includes a sensor (for example, a biosensor) that is provided in a sampling channel so as to be in contact with a sample and measures concentrations of predetermined components in the sample, an introduction path that introduces a cleaning liquid to an upstream side of the sensor of the sampling channel, and an air introduction path that is connected to the introduction path and is opened to the atmosphere. The air guided from the air introduction path flows into the sampling channel via the introduction path.


Find Patent Forward Citations

Igarashi, Masatsugu. (2026). Sampling system and sampling method (U.S. Patent No. 12637649). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12637649

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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