The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Nov. 25, 2021
Applicant:

Osaka University, Osaka, JP;

Inventors:

Hidetaka Kioka, Suita, JP;

Yusuke Takahashi, Suita, JP;

Shinichiro Fukuhara, Suita, JP;

Yasushi Sakata, Suita, JP;

Norio Nonomura, Suita, JP;

Seiji Takashima, Suita, JP;

Shigeyoshi Saito, Suita, JP;

Assignee:

OSAKA UNIVERSITY, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); A61B 5/00 (2006.01); G01R 33/485 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); A61B 5/4387 (2013.01); G01R 33/485 (2013.01);
Abstract

An evaluation method is performed by an arithmetic circuit and includes obtainment processing (S), evaluation processing (S), and presentation processing (S). The obtainment processing (S) obtains: image information on a sectional image representing an interested section of an organism including a target section of a testis of the organism generated by use of magnetic resonance of hydrogen atoms; and concentration information on a creatine concentration in the interested section measured by use of magnetic resonance based on chemical exchange saturation transfer. The evaluation processing (S) generates an evaluation image representing a distribution of evaluation results of a testicular function in the target section based on the concentration information. The presentation processing (S) presents the sectional image and the evaluation image.


Find Patent Forward Citations

Kioka, Hidetaka. (2026). Evaluation method, program, and evaluation system (U.S. Patent No. 12635897). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12635897

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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