The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Feb. 15, 2022
Applicant:

Medit Corp., Seoul, KR;

Inventors:

Dong Hoon Lee, Seoul, KR;

Myoung Woo Song, Seoul, KR;

Young Seok Jeong, Seoul, KR;

Assignee:

MEDIT CORP., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0062 (2013.01); A61B 5/0088 (2013.01); A61B 2560/0228 (2013.01); A61B 2560/0456 (2013.01);
Abstract

The present invention relates to a calibration cradle for a three-dimensional scanner. Particularly, the calibration cradle comprises: a cradle body into which a front end portion of a three-dimensional scanner is inserted and seated; a calibration pattern plate (hereinafter, abbreviated as 'pattern plate') which is disposed inside the cradle body to correct the scanning of the three-dimensional scanner; and a pattern movement part which automatically axially rotates and axially reciprocates the pattern plate in the cradle body when the three-dimensional scanner is coupled to the cradle body, whereby the present invention provides an advantage of improving the convenience and reliability of performing calibration.


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Lee, Dong. (2026). Calibration cradle for three-dimensional scanner and control method for same (U.S. Patent No. 12635882). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12635882

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